Applied Image SM-4 Micrometer Stage 1" 25.0MM
The Applied Image SM-4 is a 1-inch (25mm) linear X-axis stage micrometer designed to calibrate microscopes, imaging systems, and optical reticles. Featuring a superior line edge quality and 10 µ m divisions, it provides highly precise, NIST-traceable calibration for high-power magnification.--Used---Good Visual Condition-06/26---AP
CC 172921---SS323---T-10-1-3-A---2.00